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Samsung SH-S223F

Dec 19,2008 0

5. Testing platform - About the Quantized IQB Omni CD DVD Analyser

 

Review Pages

1. Introduction, specifications
2. CD, DVD reading tests
3. Defected CD reading tests
4. Defected DVD reading tests
5. Testing platform - About the Quantized IQB Omni CD DVD Analyser
6. CD-R writing tests - Taiyo Yuden @48x
7. CD-R writing tests - RITEK @48x
8. CD-RW writibg tests - Verbatim @32x
9. DVD+R writing tests - CMC MAG M01 @18x
10. DVD+R writing tests - DAXON AZ3 @16x
11. DVD+R writing tests - MCC 004 @20x
12. DVD+R writing tests - PRODISC R05 @16x
13. DVD+R writing tests - YUDEN T03 @22x
14. DVD-R writing tests - CMC MAG AM3 @18x
15. DVD-R writing tests - MCC 03RG20 @18x
16. DVD-R writing tests - PRODISC F02 @16x
17. DVD-R writing tests - TTH02 @16x
18. DVD-R writing tests - TYG03 @22x
19. DVD+R DL writing tests - MKM 003 000 @10x
20. DVD+R DL writing tests - RITEK S06 076 @16x
21. DVD-R DL writing tests - MKM 03RD30 @10x
22. DVD+R DL writing tests - MKM 04RD30 @12x
23. DVD+RW writing tests - MKM A03 000 @8x
24. DVD-RW writing tests - MKM 01RW9X01 @6x
25. DVD-RAM writing tests - M01J5006 @5x
26. DVD-RAM writing tests - MXL22 @12x
27. Summary of writing tests, Overburning, Bit setting
28. Final words

 

All CD/DVD writing quality tests are done using the IQB Omni CD DVD Analyser by Quantized. The IQB Omni from Quantized Systems is a physical disc analyser, covering all CD and DVD formats, designed to meet the Quality Control demands of the duplication and replication sectors.

Omni's features allows you to identify media quality issues and highlight drive performance and recording problems.

The system is based on a Philips CD/DVD drive. It supports the majority of the optical disc formats, including CD-ROM, CD-R/RW, CD-A
DVD-R/-RW, DVD-R DL, DVD+R/+RW, DVD+R DL, DVD-ROM 5 and DVD-ROM.

The platform can test the media for the following signals:

CD-R/CD-ROM/CD-A DVD+R/+RW DVD-R/-RW DVD-ROM
Reflectivity R-I14H R-I14H R-I14H
Jitter Modulation Modulation Modulation
I11/ITop Jitter Jitter Jitter
Asymmetry/Beta PI Sum 8 PI Sum 8 PI SUm 8
BLER PI Unc PI Unc PI Unc
E11 to E32 Error Statistics POF POF POF
Burst Errors Beta Beta Asymmetry
  ADER   EDC
  ADER Unc    

Test speeds for CD media are set at 16X and for DVD media at 4X.

The equipment is capable of providing mesasurments on the complete data area or at specific positions defined by the user (Quick Test mode). This zone testing procedure allows multiple areas of the disc to be tested in a single operation.

All numerical and graphical data are stored in a database. Data can be recalled with user defined criteria to create sets of related key results. Data can also be imported into most common software packages - MS Excel etc.

For more information on the Quantized IQB Omni Analyser, visit http://www.quantized.com.

In the following pages, we present the writing quality measurements of various CD and DVD recordable and rewritable media, burned with the Samsung SH-S223F burner.

 

Review Pages

1. Introduction, specifications
2. CD, DVD reading tests
3. Defected CD reading tests
4. Defected DVD reading tests
5. Testing platform - About the Quantized IQB Omni CD DVD Analyser
6. CD-R writing tests - Taiyo Yuden @48x
7. CD-R writing tests - RITEK @48x
8. CD-RW writibg tests - Verbatim @32x
9. DVD+R writing tests - CMC MAG M01 @18x
10. DVD+R writing tests - DAXON AZ3 @16x
11. DVD+R writing tests - MCC 004 @20x
12. DVD+R writing tests - PRODISC R05 @16x
13. DVD+R writing tests - YUDEN T03 @22x
14. DVD-R writing tests - CMC MAG AM3 @18x
15. DVD-R writing tests - MCC 03RG20 @18x
16. DVD-R writing tests - PRODISC F02 @16x
17. DVD-R writing tests - TTH02 @16x
18. DVD-R writing tests - TYG03 @22x
19. DVD+R DL writing tests - MKM 003 000 @10x
20. DVD+R DL writing tests - RITEK S06 076 @16x
21. DVD-R DL writing tests - MKM 03RD30 @10x
22. DVD+R DL writing tests - MKM 04RD30 @12x
23. DVD+RW writing tests - MKM A03 000 @8x
24. DVD-RW writing tests - MKM 01RW9X01 @6x
25. DVD-RAM writing tests - M01J5006 @5x
26. DVD-RAM writing tests - MXL22 @12x
27. Summary of writing tests, Overburning, Bit setting
28. Final words

 

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