Saturday, July 30, 2016
Search
  
Submit your own News for
inclusion in our Site.
Click here...
Breaking News
Alphabet Posts Strong Revenue on Video Market
Games Outweigh Sagging Sensors For Sony
Microsoft To Further Cut Jobs Towards The Final Exit From Phone Business
AMD Radeon RX 470 And RX 460 Are Shipping in Early August
Worldwide Smartphone Volumes Relatively Flat in Q2 2016
Oracle to Buy NetSuite for $9.3 Billion
Samsung and Nestle Collaborate on the Internet of Things and Nutrition
Home Appliance and Home Entertainment Units Help LG's Quarterly Profits
Active Discussions
Which of these DVD media are the best, most durable?
How to back up a PS2 DL game
Copy a protected DVD?
roxio issues with xp pro
Help make DVDInfoPro better with dvdinfomantis!!!
menu making
Optiarc AD-7260S review
cdrw trouble
 Home > News > General Computing > JEDEC P...
Last 7 Days News : SU MO TU WE TH FR SA All News

Friday, January 17, 2014
JEDEC Publishes Test Standard to Measure Effects of Proton Radiation on Electronic Devices


JEDEC Solid State Technology Association has published the JESD234 Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices.

Developed in response to the present lack of a prevailing industry standard for proton induced upset testing for electronic devices used in outer space; the new standard assists with proton testing in several areas, including pre-trip planning, decision making during the test, and post-exposure planning and analysis.

The new standard also forewarns the "bounds" to an acceptable proton test covered by this standard. For example, items discussed as being excluded in this standard are low energy proton testing (< 5MeV), proton tests with excessive total dose and the assumption that latchup testing is energy independent. JESD234 assures the user that:

- bounding an acceptable indirect ionization upset test as being done with energies between 40 - 500 MeV
- consideration must be given to device overlayers and package lids
- a discussion on the clarity between destructive and non-destructive events
- angular testing is different from that described in heavy ion testing and
- provides a listing of proton induced dominant SEEs




Previous
Next
HTC To Release Larger One Phone        All News        Nintendo Wii U Sales Keep Falling
Obama Unveils Reforms On NSA Program     General Computing News      China Develops Its Own Operating System

Get RSS feed Easy Print E-Mail this Message

Related News
JEDEC Publishes Universal Flash Storage (UFS) Removable Card Standard
JEDEC Releases GDDR5X Graphics Memory Standard
JEDEC Updates The High Bandwidth Memory (HBM) Standard
JEDEC Updates Standards for LPDDR3 And LPDDR4
JEDEC To Support for NVDIMM Hybrid Memory Modules
JEDEC Releases e.MMC Standard Update v5.1
Wide IO 2 Mobile DRAM Standard Released
JEDEC Releases LPDDR4 Standard
JEDEC Standard Allows Development Of Higher Capacity DDR3 Modules
JEDEC Rleases e.MMC Standard Update v5.0
JEDEC Publishes Universal Flash Storage Standard v2.0
JEDEC Publishes Test Standard for UFS

Most Popular News
 
Home | News | All News | Reviews | Articles | Guides | Download | Expert Area | Forum | Site Info
Site best viewed at 1024x768+ - CDRINFO.COM 1998-2016 - All rights reserved -
Privacy policy - Contact Us .