Wednesday, November 22, 2017
Search
  
Submit your own News for
inclusion in our Site.
Click here...
Breaking News
Russia Threatens to Block Ads on Google
Apple Confirms Student Personnel Worked Overtime For Hon Hai on iPhone X plant
U.S. Government Warns Businesses About Vulnerabilities Of Management Engine in Intel Chips
Samsung to set up AI Research Center
Samsung, LG Comment on USITC's Tariffs to Curb Washer Imports
Uber Paid Hackers to Keep Massive Data Breach Secret
Apple Paper Confirms Self-driving Vehicle Research
FCC Chief's Proposal Reverses the Net netruality Rules
Active Discussions
Which of these DVD media are the best, most durable?
How to back up a PS2 DL game
Copy a protected DVD?
roxio issues with xp pro
Help make DVDInfoPro better with dvdinfomantis!!!
menu making
Optiarc AD-7260S review
cdrw trouble
 Home > News > General Computing > Samsung...
Last 7 Days News : SU MO TU WE TH FR SA All News

Thursday, May 16, 2013
Samsung Announces 45 nanometer Embedded Flash Logic Process Development


Samsung Electronics has succesfully implemented the first 45 nanometer (nm) embedded flash ("eFlash") logic process into a smart card test chip, paving the way for deployment of the process on a commercial scale.

"Samsung's 45nm eFlash logic process has the potential to be broadly adopted into various components for security solutions and mobile devices, including smart card IC, NFC IC, eSE (embedded secure element) and TPM (Trusted platform module)," said Taehoon Kim, vice president of marketing, System LSI Business, Samsung Electronics. "The excellent performance from this smart card test chip will help solidify our leadership in the security IC market."

Samsung claims that the smart card IC based on its 45nm eFlash logic process guarantees high reliability and endurance of 1 million cycles per flash memory cell. Other solutions currently on the market are generally rated for 500,000 cycles.

Through the improvement in both flash cell structure and operating scheme, the test chip features random access time to read memory that is 50 percent faster and the power efficiency is enhanced by 25 percent over previous products built on the 80nm eFlash logic process.

Samsung expects to start offering initial smart card IC samples for commercialization in the second half of 2014.


Previous
Next
DivX Releases HEVC Video Profiles        All News        Samsung Gets 95 Percent Share of Global Android Smartphone Profits
DivX Releases HEVC Video Profiles     General Computing News      Google Launches All Access Music Service, Updated Maps, New Android-based Samsung Galaxy S4 at Google I/O

Get RSS feed Easy Print E-Mail this Message

Related News
Samsung, LG Comment on USITC's Tariffs to Curb Washer Imports
Samsung Says New SZ985 Z-NAND SSD Offers Ultra-Low Latency and High Throughput
Samsung Forecast to Top Intel as Larger Semiconductor Supplier in 2017
Samsung, SK Hynix and Micron Lead the Server DRAM Market
Samsung Invests More Than Intel and TSMC in Semiconductor Business
Samsung Lithium-air Battery Has Twice The Capacity of Li-ion Technology
Supreme Court Rejects Samsung Appeal in Apple Patent Case
ITC Launches Probe into Samsung's Chipmaking Patent
Samsung Unveils Business-oriented Galaxy Note8 Enterprise Edition
Samsung Reports Strong 3Q Results on Semiconductor Profits
Samsung Introduces the New Galaxy Tab A
Samsung to Support New Startups Spinning-Off from C-Lab Program

Most Popular News
 
Home | News | All News | Reviews | Articles | Guides | Download | Expert Area | Forum | Site Info
Site best viewed at 1024x768+ - CDRINFO.COM 1998-2017 - All rights reserved -
Privacy policy - Contact Us .