Thursday, April 19, 2018
Search
  
Submit your own News for
inclusion in our Site.
Click here...
Breaking News
Garmin Announces Connect IQ 3.0 with New apps from Trailforks, Yelp, iHeartRadio
Intel Open Sources the nGraph Compiler for Deep Learning Systems
Facebook Seeking to Hire Chip Designers
Regulatory Filing Hints at New iPhones
Western Digital Pushes Conventional Magnetic Hard Disk Tech to its Limits in New 14TB Ultrastar DC HC530
Retail Rivals Amazon and Best Buy Enter Exclusive Partnership to Offer New Fire TV Edition Smart TVs
ASML's Solid Q1 Results Demonstrate Further Adoption of EUV Technology
Amazon Launches the International Shopping Feature in the Amazon Shopping App
Active Discussions
Which of these DVD media are the best, most durable?
How to back up a PS2 DL game
Copy a protected DVD?
roxio issues with xp pro
Help make DVDInfoPro better with dvdinfomantis!!!
menu making
Optiarc AD-7260S review
cdrw trouble
 Home > News > General Computing > Samsung...
Last 7 Days News : SU MO TU WE TH FR SA All News

Thursday, May 16, 2013
Samsung Announces 45 nanometer Embedded Flash Logic Process Development


Samsung Electronics has succesfully implemented the first 45 nanometer (nm) embedded flash ("eFlash") logic process into a smart card test chip, paving the way for deployment of the process on a commercial scale.

"Samsung's 45nm eFlash logic process has the potential to be broadly adopted into various components for security solutions and mobile devices, including smart card IC, NFC IC, eSE (embedded secure element) and TPM (Trusted platform module)," said Taehoon Kim, vice president of marketing, System LSI Business, Samsung Electronics. "The excellent performance from this smart card test chip will help solidify our leadership in the security IC market."

Samsung claims that the smart card IC based on its 45nm eFlash logic process guarantees high reliability and endurance of 1 million cycles per flash memory cell. Other solutions currently on the market are generally rated for 500,000 cycles.

Through the improvement in both flash cell structure and operating scheme, the test chip features random access time to read memory that is 50 percent faster and the power efficiency is enhanced by 25 percent over previous products built on the 80nm eFlash logic process.

Samsung expects to start offering initial smart card IC samples for commercialization in the second half of 2014.


Previous
Next
DivX Releases HEVC Video Profiles        All News        Samsung Gets 95 Percent Share of Global Android Smartphone Profits
DivX Releases HEVC Video Profiles     General Computing News      Google Launches All Access Music Service, Updated Maps, New Android-based Samsung Galaxy S4 at Google I/O

Get RSS feed Easy Print E-Mail this Message

Related News
Samsung to Release Its First MicroLED TVs in 2018
Samsung Galaxy J2 Pro Smartphone Has no Data Connectivity
Samsung 360 Round 3D Video Camera and Samsung DeX Pad Now Available
Samsung Reports Profit on High Memory Sales
Samsung Launches the Notebook Odyssey Z for Gaming
Samsung Notebook 5 and Notebook 3 Target General Users
Samsung Breaks Ground in New Memory fab Line in Xian
Samsung Electronics Shareholders Approve Stock Split, Company Talks About Future for Smartphones, Chips
New Samsung Exynos 7 Series 9610 Mobile Processor focuses on Multimedia
Samsung Expands its 8-Inch Foundry Offerings with New RF/IoT and Fingerprint Technology Solutions
Samsung's Ruggedized Galaxy Tab Active2 Now Available in the U.S.
Samsung Debuts First 3D Cinema LED Screen Theater in Switzerland

Most Popular News
 
Home | News | All News | Reviews | Articles | Guides | Download | Expert Area | Forum | Site Info
Site best viewed at 1024x768+ - CDRINFO.COM 1998-2018 - All rights reserved -
Privacy policy - Contact Us .