JEDEC Publishes Test Standard to Measure Effects of Proton Radiation on Electronic Devices - Printer Friendly version without Comments

Appeared on: Friday, January 17, 2014
JEDEC Publishes Test Standard to Measure Effects of Proton Radiation on Electronic Devices

JEDEC Solid State Technology Association has published the JESD234 Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices.

Developed in response to the present lack of a prevailing industry standard for proton induced upset testing for electronic devices used in outer space; the new standard assists with proton testing in several areas, including pre-trip planning, decision making during the test, and post-exposure planning and analysis.

The new standard also forewarns the "bounds" to an acceptable proton test covered by this standard. For example, items discussed as being excluded in this standard are low energy proton testing (< 5MeV), proton tests with excessive total dose and the assumption that latchup testing is energy independent. JESD234 assures the user that:

- bounding an acceptable indirect ionization upset test as being done with energies between 40 - 500 MeV
- consideration must be given to device overlayers and package lids
- a discussion on the clarity between destructive and non-destructive events
- angular testing is different from that described in heavy ion testing and
- provides a listing of proton induced dominant SEEs