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Tuesday, April 27, 2010
Pulstec to Showcase New MASTER Blu-ray Disc Evaluation System at Mediatech Show


Pulstec will have on display its 2x MASTER evaluation system for Blu-ray discs at the MEDIA-TECH Global Expo & Summit held May 19, 2010 - May 21, 2010 in Frankfurt, Germany.

The new MASTER system has been designed on the basic concept of Pulstec's high-end Tester, but it is more compact and of course, more affordable.

The system automatically evaluates the electric characteristics of Blu-ray discs and can be used in a wide range of fields such as production and quality control.

Pulstec's updated system offers shorter evaluation time with the same quality of the companby's currently available MASTER system. The new system is capable of 2x evaluation of the electric characteristics of BD-R/RE and multilayer discs (BD-ROM SL / DL, BD-R SL / DL HTL, BD-R SL / DL LTH, BD-RE SL / DL).

The MASTER has also an excellent correlation with the company's high-end Tester (ODU-1000 and INSPECTOR), the company claims. The newly designed hardware equips the basic parts such as PUH, evaluation circuit etc. that are also used in the high-end ODU-1000 and INSPECTOR. In addition, the MASTER uses the same measurement algorithm used by the ODU-1000 automatic measurement system, which the company has adopted in its certified testing centers for Blu-ray.

Other features of the new system includes the ability to control up to 6 MASTER testers from a single PC. Two screen modes are available: the Manager Mode allows users to select the measuring parameter freely, while the Operator Mode features fixed measuring parameters.

Shorcut keys are also provided in order to easily initiate specific measurements. A maximum of 30 measurement conditions can be set into each key. An interactive wizard is also provided guiding the user of the device throughout the various measurements.

The measurement data is displayed in ONE page in the summary/result page, so it is easy to check the data measured in the past. Any results already stored in the device are searchable using the dates and keywords in the device's search function.



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