Tuesday, March 31, 2015
Search
  
Submit your own News for
inclusion in our Site.
Click here...
Breaking News
Facebook User Tracking Violates EU Law, Research Says
Google Releases Cheaper Chromebooks
Intel Releases New Braswell SoCs
WD's My Passport X Delivers 2 TB of Storage for Xbox One and PC Gamers
Google To Use SSDs From Samsung: report
Microsoft Introduces The Surface 3
Samsung Now Offers New Lineup of 3-bit V-NAND Based 850 EVO SSDs for Ultrathin PCs
Samsung, LG End Legal Disputes
Active Discussions
how to copy and move data files to dvd-rw
cdrw trouble
Need serious help!!!!
burning
nvidia 6200 review
Hello
Burning Multimedia in track 0
I'm lazy. Please help.
 Home > News > General Computing > Toshiba...
Last 7 Days News : SU MO TU WE TH FR SA All News

Monday, April 16, 2007
Toshiba's New SSRM Technology to Improve Cutting-Edge LSI


Toshiba today announced that it has achieved a breakthrough in imaging electron-carrier paths and impurities in semiconductors that allows analysis at the 1-nanometer (nm) level for the first time.

This major advance, based on scanning spreading resistance microscopy (SSRM) is an essential step toward achieving LSI at the 45nm generation and beyond.

Toshiba will introduce its breakthrough approach at the International Reliability Physics Symposium (IRPS), the international conference on semiconductor reliability, which is now being held in Phoenix, Arizona. Toshiba will present the results on April 19th (local time), the last day of the conference.

Scanning spreading resistance microscopy (SSRM) is a preferred technology for two-dimensional profiling of localized resistance on a semiconductor cross-sectional surface, allowing analysis of the distribution of electron carriers and impurities. The demanding tolerances required for 45nm generation LSI makes it essential to understand electron-carrier density in the carrier channel, and to be able to control doping with 1nm-level precision, as slight differences in electrical characteristics can lead to increased current leakage and risk of short circuiting.

SSRM uses a scanning probe to produce two-dimensional images of carriers in semiconductor device. These images reveal impurity induced resistance variation and allow analysis of electron-flow paths. However, the level of precision and repeatable generation of high resolution SSRM images with conventional available probes has remained at around 5 nm.

Problems with SSRM stem from two sources: degraded imaging accuracy due to the influence of water vapor on the sample: and the difficulty of controlling a sufficiently stable contact between the sample and the probe. To overcome these factors, Toshiba installed the SSRM in a vacuum environment and refined the positioning of the probe. This allowed the company to optimize performance and advance to the 1nm level, the highest precision yet achieved. Toshiba has already applied this breakthrough to LSI development with 45 nm generation process technology.


Previous
Next
Nokia Unveiled the Nokia 8800 Sirocco Gold        All News        Sandisk and Sony Announce SxS Memory Card Specification
Adobe Ships Creative Suite 3     General Computing News      Sandisk and Sony Announce SxS Memory Card Specification

Get RSS feed Easy Print E-Mail this Message

Related News
Toshiba, Sandisk, Develop First 48-layer 3D NAND For SSDs
Toshiba Expands Line-up of eMMC Version 5.1 Embedded NAND Flash Memory Products
Toshiba Starts Production of 13-Megapixel CMOS Image Sensor With "Bright Mode" Video Technology
Toshiba Expands Internal and External Desktop Hard Drive Lineup With New 6TB Models
Toshiba Debuts 12.0 Gbps SAS HDD
Toshiba Starts Shipping 20-Megapixel CMOS Image Sensor For Mobile Devices
New Toshiba Smartwatch Reference Model features Bluetooth connectivity and Qi Wireless Charging
Toshiba Develops STT-MRAM Circuit For High-performance Processors
Toshiba Develops Multicore SoC For Image-Recognition Applications
Toshiba Launches 8 Megapixel CMOS Image Sensor for Smartphones and Tablets
Toshiba Introduces New APs For For IoT Solutions
Toshiba Achieves 1Tbit per Square Inch Areal Density in a 2.5-Inch Hard Disk Drive

Most Popular News
 
Home | News | All News | Reviews | Articles | Guides | Download | Expert Area | Forum | Site Info
Site best viewed at 1024x768+ - CDRINFO.COM 1998-2015 - All rights reserved -
Privacy policy - Contact Us .