Saturday, August 27, 2016
Search
  
Submit your own News for
inclusion in our Site.
Click here...
Breaking News
Facebook 'Trending' To Rely Less On Humans
Apple Patches iOS Security Flaws Discovered In Spyware Targeting Activist
LG To Showcase Latest OLED TVs Compatible With HDR Technologies At IFA
NHK Join Forces With Panasonic And Sony To Win The 8K TV Race
Intel Introduces New 3D NAND SSDs
Facebook To Use Personal Data From WhatsApp To Bring You Personalized Ads
Amazon Introduces Car Research Portal
Google Uses Artificial Intelligence To Compress Images
Active Discussions
Which of these DVD media are the best, most durable?
How to back up a PS2 DL game
Copy a protected DVD?
roxio issues with xp pro
Help make DVDInfoPro better with dvdinfomantis!!!
menu making
Optiarc AD-7260S review
cdrw trouble
 Home > News > General Computing > Toshiba...
Last 7 Days News : SU MO TU WE TH FR SA All News

Monday, April 16, 2007
Toshiba's New SSRM Technology to Improve Cutting-Edge LSI


Toshiba today announced that it has achieved a breakthrough in imaging electron-carrier paths and impurities in semiconductors that allows analysis at the 1-nanometer (nm) level for the first time.

This major advance, based on scanning spreading resistance microscopy (SSRM) is an essential step toward achieving LSI at the 45nm generation and beyond.

Toshiba will introduce its breakthrough approach at the International Reliability Physics Symposium (IRPS), the international conference on semiconductor reliability, which is now being held in Phoenix, Arizona. Toshiba will present the results on April 19th (local time), the last day of the conference.

Scanning spreading resistance microscopy (SSRM) is a preferred technology for two-dimensional profiling of localized resistance on a semiconductor cross-sectional surface, allowing analysis of the distribution of electron carriers and impurities. The demanding tolerances required for 45nm generation LSI makes it essential to understand electron-carrier density in the carrier channel, and to be able to control doping with 1nm-level precision, as slight differences in electrical characteristics can lead to increased current leakage and risk of short circuiting.

SSRM uses a scanning probe to produce two-dimensional images of carriers in semiconductor device. These images reveal impurity induced resistance variation and allow analysis of electron-flow paths. However, the level of precision and repeatable generation of high resolution SSRM images with conventional available probes has remained at around 5 nm.

Problems with SSRM stem from two sources: degraded imaging accuracy due to the influence of water vapor on the sample: and the difficulty of controlling a sufficiently stable contact between the sample and the probe. To overcome these factors, Toshiba installed the SSRM in a vacuum environment and refined the positioning of the probe. This allowed the company to optimize performance and advance to the 1nm level, the highest precision yet achieved. Toshiba has already applied this breakthrough to LSI development with 45 nm generation process technology.


Previous
Next
Nokia Unveiled the Nokia 8800 Sirocco Gold        All News        Sandisk and Sony Announce SxS Memory Card Specification
Adobe Ships Creative Suite 3     General Computing News      Sandisk and Sony Announce SxS Memory Card Specification

Get RSS feed Easy Print E-Mail this Message

Related News
Toshiba to Implement Eyefi Connected Features in Next FlashAir SD Cards
Toshiba Debuts Flashmatrix Technology
Toshiba Announces New BG SSDs with 3-Bit-Per-Cell TLC BiCS FLASH
Toshiba's ZD6000 Dual Port NVMe SSD Offers A Capacity Of 7.68TB
Toshiba PC Business Not Affected By Company's Restructuring
Toshiba Develops High-Speed MTJ Element for Non-Volatile STT-MRAM For 2X nm Generation Transistors
Toshiba Develops Circuit Technology for Small Area Non-volatile FPGAs
New Imaging Technique Can Simultaneously Acquire a Color Image and Depth Map from a Single Image Taken with a Monocular Camera
New Toshiba 8TB X300 Hard Disk Drive Released
Fujitsu, Vaio, Toshiba, Abandon PC Merger Plans
New Toshiba Q300 And Q300 Pro Family Of SSDs Launch With 15nm TLC Flash Memory
Toshiba Recalls Laptop Computer Battery Packs Due to Burn and Fire Hazards

Most Popular News
 
Home | News | All News | Reviews | Articles | Guides | Download | Expert Area | Forum | Site Info
Site best viewed at 1024x768+ - CDRINFO.COM 1998-2016 - All rights reserved -
Privacy policy - Contact Us .